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authorDmitriy Sobolev <Dmitriy.Sobolev@intel.com>2021-02-25 14:00:07 +0300
committerMikhail Dvorskiy <mikhail.dvorskiy@intel.com>2021-02-25 16:45:26 +0300
commit9234399da7381fcabb3ceabb8370567a8d109dab (patch)
tree79f4d7077fb3d3973b98a5536ba5e40904dffcad
parent[dpc++][ranges] the tests for passing "sycl buffer" as "pseudo-range" (diff)
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Reduce number of elements to scan due to taking too much time when testing (#142)
* Reduce number of elements to scan because of taking too much time * Do not change number of elements when using release mode Signed-off-by: Sobolev, Dmitriy <dmitriy.sobolev@intel.com>
-rw-r--r--test/parallel_api/numeric/numeric.ops/scan.pass.cpp9
1 files changed, 8 insertions, 1 deletions
diff --git a/test/parallel_api/numeric/numeric.ops/scan.pass.cpp b/test/parallel_api/numeric/numeric.ops/scan.pass.cpp
index 22a8acfa1a5d..3c302b07b4f4 100644
--- a/test/parallel_api/numeric/numeric.ops/scan.pass.cpp
+++ b/test/parallel_api/numeric/numeric.ops/scan.pass.cpp
@@ -159,7 +159,14 @@ test_with_plus(T init, T trash, Convert convert)
}
#if _ONEDPL_BACKEND_SYCL && !_ONEDPL_FPGA_DEVICE
- unsigned long n = 100000000;
+ // testing of large number of items may take too much time in debug mode
+ unsigned long n =
+#if PSTL_USE_DEBUG
+ 70000000;
+#else
+ 100000000;
+#endif
+
Sequence<T> in(n, convert);
Sequence<T> expected(in);
Sequence<T> out(n, [&](int32_t) { return trash; });